英文字典中文字典


英文字典中文字典51ZiDian.com



中文字典辞典   英文字典 a   b   c   d   e   f   g   h   i   j   k   l   m   n   o   p   q   r   s   t   u   v   w   x   y   z       







请输入英文单字，中文词皆可：


请选择你想看的字典辞典：
单词字典翻译
Reentering查看　Reentering　在百度字典中的解释百度英翻中〔查看〕
Reentering查看　Reentering　在Google字典中的解释Google英翻中〔查看〕
Reentering查看　Reentering　在Yahoo字典中的解释Yahoo英翻中〔查看〕

安装中文字典英文字典查询工具!


中文字典英文字典工具:
选择颜色:
输入中英文单字

































































英文字典中文字典相关资料:


  • Trackability of distal access catheters: an in vitro quantitative . . .
    In vitro testing DACs were successfully delivered to the target M1 in 60 of 63 in vitro experiments (95 24 %) All tested DACs could reach the target M1 using either of the three navigation techniques, except for ACE 68, in which case DAC alone could not reach the target site and DAC-mC or DAC-SR was necessary The measured track forces and max
  • A TWO-STEP DDEM ADC FOR ACCURATE AND COST-EFFECTIVE DAC TESTING
    testing high-resolution DACs Build-in self-test (BIST) is believed to be a promising alternative strategy for testing data converters BIST strategies implement some or all test blocks on chip to make the test process easy and cost-efficient A BIST scheme for DAC testing usually needs to have a measurement ADC fabricated on the same chip as a
  • Federal Student Aid
    Federal Student Aid offers resources and tools to help students manage their financial aid, including loan repayment options and FAFSA application
  • A Two-Step DDEM ADC for Accurate and Cost-Effective DAC Testing
    Effective DAC Testing Hanqing Xing, Degang Chen, Randall Geiger Department of Electrical and Computer Engineering Iowa State University Ames, IA 50011, USA xinghq@iastate edu, djchen@iastate edu, rlgeiger@iastate edu Abstract— This paper presents a scheme for testing DACs’ static non-linearity errors by using a two-step flash ADC with
  • ANOVA-Based Approach for DAC Diagnostics - Academia. edu
    Pseudorandom patterns used for testing DACs with N bits have been obtained through the basic formula (i · seed)mod 2N i = 1, , 2N , in which i · seed represents a dividend, 2N a divisor, and mod stands for modulo operator For any odd integer value assigned to seed, when i ranges from 1 up to 2N , a complete pattern of codes is obtained
  • Chapter 5 Testing Converters F - Analog
    generally performs production testing on DACs using specialized automatic test equipment On the other hand, a customer evaluating various DACs for use in a system does not generally have access to sophisticated automatic test equipment and must therefore devise a suitable bench test setup A basic DAC static test setup is shown in Figure 5 1
  • UT Dallas SSO Login - University of Texas System
    Usage may be subject to security testing and monitoring Misuse is subject to criminal prosecution No expectation of privacy except as otherwise provided by applicable privacy laws
  • Testing of Precision DACs Using Low-Resolution ADCs with Dithering
    The bottleneck of DAC testing is the fast and accurate measurement devices Production testing of high-resolution DACs with Giga Hertz clock rates is a challenging problem, and there is no widely adopted approach for on-chip testing of precision DACs in an SoC system This work presents a new approach for testing high-resolution DACs
  • DAC A B Test Procedure Question? | Super Best Audio Friends
    I'm trying to set up an A B test between a few DACs using my preamp and I wonder if there is anything wrong with my procedure Right now I have the DACs set up like this: DAC A (which IS a renderer) plays FLAC files off my NAS DAC A has digital outs DAC A is connected to input 1 of the preamp with a balanced connection
  • Davis Technical College (Formerly DATC)
    By submitting the form below, your information will be added to our Emergency Notifications contact list In the event of an emergency at Davis Technical College, you may receive emails, texts and or phone calls to make you aware of the situation at college
  • Index [arcb. csc. ncsu. edu]
    Index D E S D dacs_barrier_wait; dacs_de_start; dacs_de_test; dacs_de_wait; dacs_errhandler_reg
  • UPDATE: STANDARDS, ASSESSMENT, ACCOUNTABILITY - Nebraska
    ACT materials are sent to the high school or program test site • DACs will be assigned passwords in all the NSCAS test management systems, and he or she may designate as many users inside the district as needed The Statewide Assessment office will maintain the list with one official contact It is important that
  • Testing of Precision DACs Using Low-Resolution ADCs with Dithering
    self-test (BIST) scheme for DACs using an accurate sample-and-subtract circuit, a linear VCO, and a stable clock counter [4] An overall review of existing built-in self-test approaches for DACs can be found in their paper In spite of these efforts, testing of high-speed precision DACs remains as a problem It puts stringent requirements
  • (PDF) Testing high resolution DACs: A contribution to draft standard . . .
    The bottleneck of DAC testing is the fast and accurate measurement devices Production testing of highresolution DACs with Giga Hertz clock rates is a challenging problem, and there is no widely adopted approach for on-chip testing of precision DACs in an SoC system This work presents a new approach for testing high-resolution DACs
  • DAC blind tests? EVER? - Audio Science Review (ASR) Forum
    Still I personally think that there would be more value in a single blind test comprising 5 or more popular DACs at different price points than another 50 individual DAC tests There is merit in having measurements for as many products as possible, but at this point I think what the broader audio community really needs is a better





中文字典-英文字典  2005-2009